Monitoring Electron Microscope Performance

the scanning electron microscope

it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...

Electron Microscope

Optimising the Performance of a Tungsten Hairpin Scanning Electron Microscope

With many scanning electron microscope operators using their instruments based upon training given during the initial installation, information is being lost or misunderstood. Modern techniques may in many cases be applied to the older tungsten hairpin instruments. These actions enable the operators to obtain far more information and a better understanding of their specimen, both of its surface...

Electron Microscope Unit

Origin of the Electron Microscope.

In 1878, Ernst Abbe (1) proved that the resolution of the optical microscope is limited by the wavelength of light. This meant that even when immersion optics and ultraviolet light are used, the smallest detail that can ever be resolved optically is of the order of 100 millimicrons, or 10 angstroms. No means were conceived of resolving finer detail until two discoveries were made: (i) the wave ...